manoj sachdev

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  1. CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
    CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
    Andrei Pavlov
    Springer Netherlands
    Ebook
    Sofort lieferbar
    As technology scales into nano-meter region, design and test of Static Random Access Memories (SRAMs) becomes a highly complex task. Process disturbances and various defect mechanisms contribute to...
    160,49 €
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  2. ESD Protection Device and Circuit Design for Advanced CMOS Technologies
    ESD Protection Device and Circuit Design for Advanced CMOS Technologies
    Oleg Semenov
    Springer Netherlands
    Ebook
    Sofort lieferbar
    The challenges associated with the design and implementation of Electrostatic Discharge (ESD) protection circuits are becoming increasingly complex as technology is scaled well into nano-metric reg...
    171,19 €
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  3. Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
    Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
    Manoj Sachdev
    Springer US
    Ebook
    Sofort lieferbar
    Failures of nano-metric technologies owing to defects and shrinking process tolerances give rise to significant challenges for IC testing. As the variation of fundamental parameters such as channel...
    213,99 €
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  4. Thermal and Power Management of Integrated Circuits
    Thermal and Power Management of Integrated Circuits
    Arman Vassighi
    Springer US
    Ebook
    Sofort lieferbar
    Thermal modeling of high performance circuits and systems is a crucial component for thermal and power management. The VLSI community is currently lacking a methodology to model and estimate juncti...
    96,29 €
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  5. Defect Oriented Testing for CMOS Analog and Digital Circuits
    Defect Oriented Testing for CMOS Analog and Digital Circuits
    Manoj Sachdev
    Springer US
    Ebook
    Sofort lieferbar
    Defect oriented testing is expected to play a significant role in coming generations of technology. Smaller feature sizes and larger die sizes will make ICs more sensitive to defects that can not b...
    85,59 €
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  6. Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
    Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
    José Pineda de Gyvez
    Springer US, Springer New York
    Buch
    Bezug 11-15
    Defect-oriented testing methods have come a long way from a mere interesting academic exercise to a hard industrial reality. Many factors have contributed to its industrial acceptance. Traditional ...
    242,98 €
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  7. Esd Protection Device and Circuit Design for Advanced CMOS Technologies
    Esd Protection Device and Circuit Design for Advanced CMOS Technologies
    Oleg Semenov
    Springer
    Buch
    Bezug 11-15
    ESD Protection Device and Circuit Design for Advanced CMOS Technologies is intended for practicing engineers working in the areas of circuit design, VLSI reliability and testing domains...
    207,67 €
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  8. Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
    Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
    José Pineda de Gyvez
    Springer US, Springer New York
    Taschenbuch
    Bezug 11-15
    Defect-oriented testing methods have come a long way from a mere interesting academic exercise to a hard industrial reality. Many factors have contributed to its industrial acceptance. Traditional ...
    242,98 €
    Alle Preise inkl. MwSt | Versandkostenfrei
    In den Warenkorb Zum Merkzettel
  9. ESD Protection Device and Circuit Design for Advanced CMOS Technologies
    ESD Protection Device and Circuit Design for Advanced CMOS Technologies
    Oleg Semenov
    Springer Netherlands, Springer Netherlands
    Taschenbuch
    Bezug 11-15
    ESD Protection Device and Circuit Design for Advanced CMOS Technologies is intended for practicing engineers working in the areas of circuit design, VLSI reliability and testing domains...
    207,67 €
    Alle Preise inkl. MwSt | Versandkostenfrei
    In den Warenkorb Zum Merkzettel
  10. Thermal and Power Management of Integrated Circuits
    Thermal and Power Management of Integrated Circuits
    Manoj Sachdev
    Springer US, Springer New York
    Taschenbuch
    Bezug 11-15
    In Thermal and Power Management of Integrated Circuits, power and thermal management issues in integrated circuits during normal operating conditions and stress operating conditions are addresse...
    125,28 €
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  11. CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
    CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
    Manoj Sachdev
    Springer Netherlands, Springer Netherlands
    Taschenbuch
    Bezug 11-15
    CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies covers a broad range of topics related to SRAM design and test. From SRAM operation basics through cell ...
    195,90 €
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