josé pineda de gyvez

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  1. Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
    Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
    Manoj Sachdev
    Springer US
    Ebook
    Sofort lieferbar
    Failures of nano-metric technologies owing to defects and shrinking process tolerances give rise to significant challenges for IC testing. As the variation of fundamental parameters such as channel...
    213,99 €
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  2. Low-Power High-Resolution Analog to Digital Converters
    Low-Power High-Resolution Analog to Digital Converters
    Amir Zjajo
    Springer Netherlands
    Ebook
    Sofort lieferbar
    With the fast advancement of CMOS fabrication technology, more and more signal-processing functions are implemented in the digital domain for a lower cost, lower power consumption, higher yield, an...
    53,49 €
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  3. Integrated Circuit Defect-Sensitivity: Theory and Computational Models
    Integrated Circuit Defect-Sensitivity: Theory and Computational Models
    José Pineda de Gyvez
    Springer US
    Ebook
    Sofort lieferbar
    The history of this book begins way back in 1982. At that time a research proposal was filed with the Dutch Foundation for Fundamental Research on Matter concerning research to model defects in the...
    96,29 €
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  4. Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
    Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
    José Pineda de Gyvez
    Springer US, Springer New York
    Buch
    Bezug 11-15
    Defect-oriented testing methods have come a long way from a mere interesting academic exercise to a hard industrial reality. Many factors have contributed to its industrial acceptance. Traditional ...
    242,98 €
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  5. Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
    Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
    José Pineda de Gyvez
    Springer US, Springer New York
    Taschenbuch
    Bezug 11-15
    Defect-oriented testing methods have come a long way from a mere interesting academic exercise to a hard industrial reality. Many factors have contributed to its industrial acceptance. Traditional ...
    242,98 €
    Alle Preise inkl. MwSt | Versandkostenfrei
    In den Warenkorb Zum Merkzettel
  6. Low-Power High-Resolution Analog to Digital Converters
    Low-Power High-Resolution Analog to Digital Converters
    Amir Zjajo
    Springer
    Buch
    Bezug 11-15
    With the fast advancement of CMOS fabrication technology, more and more signal-processing functions are implemented in the digital domain for a lower cost, lower power consumption, higher yield,...
    64,23 €
    Alle Preise inkl. MwSt | Versandkostenfrei
    In den Warenkorb Zum Merkzettel
  7. Integrated Circuit Defect-Sensitivity: Theory and Computational Models
    Integrated Circuit Defect-Sensitivity: Theory and Computational Models
    José Pineda de Gyvez
    Springer US, Springer New York
    Taschenbuch
    Bezug 11-15
    The history of this book begins way back in 1982. At that time a research proposal was filed with the Dutch Foundation for Fundamental Research on Matter concerning research to model defects in the...
    125,28 €
    Alle Preise inkl. MwSt | Versandkostenfrei
    In den Warenkorb Zum Merkzettel
  8. Low-Power High-Resolution Analog to Digital Converters
    Low-Power High-Resolution Analog to Digital Converters
    José Pineda de Gyvez
    Springer Netherlands, Springer Netherlands
    Taschenbuch
    Bezug 11-15
    With the fast advancement of CMOS fabrication technology, more and more signal-processing functions are implemented in the digital domain for a lower cost, lower power consumption, higher yield,...
    64,23 €
    Alle Preise inkl. MwSt | Versandkostenfrei
    In den Warenkorb Zum Merkzettel
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