amith singhee

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  1. Novel Algorithms for Fast Statistical Analysis of Scaled Circuits
    Novel Algorithms for Fast Statistical Analysis of Scaled Circuits
    Amith Singhee
    Springer Netherlands
    Ebook
    Sofort lieferbar
    As VLSI technology moves to the nanometer scale for transistor feature sizes, the impact of manufacturing imperfections result in large variations in the circuit performance. Traditional CAD tools ...
    96,29 €
    Alle Preise inkl. MwSt
    In den Warenkorb Zum Merkzettel
  2. Extreme Statistics in Nanoscale Memory Design
    Extreme Statistics in Nanoscale Memory Design
    Amith Singhee
    Springer New York
    Ebook
    Sofort lieferbar
    Extreme Statistics in Nanoscale Memory Design brings together some of the world's leading experts in statistical EDA, memory design, device variability modeling and reliability modeling, to compile...
    149,79 €
    Alle Preise inkl. MwSt
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  3. Extreme Statistics in Nanoscale Memory Design
    Extreme Statistics in Nanoscale Memory Design
    Rob A. Rutenbar
    Springer US, Springer US
    Taschenbuch
    Bezug 11-15
    Knowledge exists: you only have to ?nd it VLSI design has come to an important in?ection point with the appearance of large manufacturing variations as semiconductor technology has moved to 45 nm f...
    184,13 €
    Alle Preise inkl. MwSt | Versandkostenfrei
    In den Warenkorb Zum Merkzettel
  4. Extreme Statistics in Nanoscale Memory Design
    Extreme Statistics in Nanoscale Memory Design
    Amith Singhee
    Springer Us
    Buch
    Bezug 11-15
    Knowledge exists: you only have to ?nd it VLSI design has come to an important in?ection point with the appearance of large manufacturing variations as semiconductor technology has moved to 45 nm f...
    184,13 €
    Alle Preise inkl. MwSt | Versandkostenfrei
    In den Warenkorb Zum Merkzettel
  5. Novel Algorithms for Fast Statistical Analysis of Scaled Circuits
    Novel Algorithms for Fast Statistical Analysis of Scaled Circuits
    Rob A. Rutenbar
    Springer Netherlands, Springer Netherlands
    Taschenbuch
    Bezug 11-15
    As VLSI technology moves to the nanometer scale for transistor feature sizes, the impact of manufacturing imperfections result in large variations in the circuit performance. Traditional CAD too...
    125,28 €
    Alle Preise inkl. MwSt | Versandkostenfrei
    In den Warenkorb Zum Merkzettel
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